Two Chinese Investigators Arrested in the US, Suspected of Stealing Trade Secrets | World



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The first researcher involved Guan Lei (29 years old) from the University of California, Los Angeles. The US Department of Justice announced the arrest of this person to investigate the case of transfer of sensitive software or technical data from the US to the China National Defense Technology University.
The investigating agency suspects that this person destroyed the investigative evidence. Guan will be indicted on September 17 with a maximum sentence of 20 years in prison.

The second case concerns researcher Haizhou Hu from the University of Virginia. According to the US Department of Justice, Mr. Hu (34) was charged with unauthorized access to computers and stealing trade secrets.

Mr. Hu works in fluid dynamics and biological simulation. Investigators discovered that Mr. Hu was carrying investigative simulation software that he was not authorized to possess as he prepared to board a plane at an Illinois airport to return to China on August 25.

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According to the United States Department of Justice, the documents that Mr. Hu brought with him were the result of years of research by the academic community at the University of Virginia. The case of this Chinese investigator is under further investigation.




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